IEEE - Institute of Electrical and Electronics Engineers, Inc. - Signature Analyzer Design for Yield Learning Support

2006 IEEE International Test Conference

Author(s): N.P. Patil ; S. Mitra ; S.S. Lumetta
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Santa Clara, CA, USA
Conference Date: 22 October 2006
Page(s): 1 - 10
ISBN (CD): 1-4244-0292-1
ISBN (Paper): 1-4244-0291-3
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2006.297719
Regular:

Signature analyzers are designed to enable identification of failing test response bits directly from failing signatures, without any special diagnosis mode. This ability is useful for yield... View More

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