IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multi Strobe Circuit for 2.133GHz Memory Test System

2006 IEEE International Test Conference

Author(s): K. Yamamoto ; M. Suda ; T. Okayasu ; H. Niijima ; K. Tanaka
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Santa Clara, CA, USA
Conference Date: 22 October 2006
Page(s): 1 - 9
ISBN (CD): 1-4244-0292-1
ISBN (Paper): 1-4244-0291-3
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2006.297711
Regular:

This paper presents solutions to reduce measurement error and test time in an AC characteristic test of a source-synchronous device. In order to realize such a solution, we developed a multi... View More

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