IEEE - Institute of Electrical and Electronics Engineers, Inc. - Technique to Detect RF Interface and Contact Issues During Production Testing

2006 IEEE International Test Conference

Author(s): M. Dresler
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Santa Clara, CA, USA
Conference Date: 22 October 2006
Page(s): 1 - 6
ISBN (CD): 1-4244-0292-1
ISBN (Paper): 1-4244-0291-3
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2006.297703
Regular:

Most of today's production programs do not use automatic tests for RF pins to ensure proper coaxial cable interfacing, matching functionality and board to device contact. This paper will describe... View More

Advertisement