IEEE - Institute of Electrical and Electronics Engineers, Inc. - At-Speed Structural Test For High-Performance ASICs

2006 IEEE International Test Conference

Author(s): V. Iyengar ; T. Yokota ; K. Yamada ; T. Anemikos ; B. Bassett ; M. Degregorio ; R. Farmer ; G. Grise ; M. Johnson ; D. Milton ; M. Taylor ; F. Woytowich
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Santa Clara, CA, USA
Conference Date: 22 October 2006
Page(s): 1 - 10
ISBN (CD): 1-4244-0292-1
ISBN (Paper): 1-4244-0291-3
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2006.297686
Regular:

At-speed test of integrated circuits is becoming critical to detect subtle delay defects. Existing structural at-speed test methods are inadequate because they are unable to supply... View More

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