IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Study of Per-Pin Timing Jitter Scope

2006 IEEE International Test Conference

Author(s): T.J. Yamaguchi ; S. Iwamoto ; M. Ishida ; M. Soma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Santa Clara, CA, USA
Conference Date: 22 October 2006
Page(s): 1 - 7
ISBN (CD): 1-4244-0292-1
ISBN (Paper): 1-4244-0291-3
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2006.297654
Regular:

This paper proposes a new cost-effective solution for jitter testing. It measures timing jitter using a combination of voltage comparators in the pin electronics as a 1.6-bit ADC, and digital... View More

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