IEEE - Institute of Electrical and Electronics Engineers, Inc. - Optimizing the Cost of Test at Intel Using per Device Data

2006 IEEE International Test Conference

Author(s): R. Edmondson ; G. Iovino ; R. Kacprowicz
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Santa Clara, CA, USA
Conference Date: 22 October 2006
Page(s): 1 - 8
ISBN (CD): 1-4244-0292-1
ISBN (Paper): 1-4244-0291-3
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2006.297649
Regular:

The optimization of Intel Corporation's test process and test cost by the utilization of data from previous test steps and devices in order to make flow level and unit level testing decisions,... View More

Advertisement