IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Novel and Practical Control Scheme for Inter-Clock At-Speed Testing

2006 IEEE International Test Conference

Author(s): H. Furukawa ; Xiaoqing Wen ; Laung-Terng Wang ; Boryau Sheu ; Zhigang Jiang ; Shianling Wu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Santa Clara, CA, USA
Conference Date: 22 October 2006
Page(s): 1 - 10
ISBN (CD): 1-4244-0292-1
ISBN (Paper): 1-4244-0291-3
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2006.297641
Regular:

The quality of at-speed testing is being severely challenged by the problem that an inter-clock logic block existing between two synchronous clocks is not efficiently tested or totally ignored due... View More

Advertisement