IEEE - Institute of Electrical and Electronics Engineers, Inc. - Testing of UltraSPARC T1 Microprocessor and its Challenges

2006 IEEE International Test Conference

Author(s): P.J. Tan ; Tung Le ; Keng-Hian Ng ; Prasad Mantri ; J. Westfall
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Santa Clara, CA, USA
Conference Date: 22 October 2006
Page(s): 1 - 10
ISBN (CD): 1-4244-0292-1
ISBN (Paper): 1-4244-0291-3
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2006.297637
Regular:

This paper presents the testing methodology of the UltraSPARC T1 microprocessor and the challenges to productizing the industry's first 8 cores and 32 thread microprocessor. The challenges include... View More

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