IEEE - Institute of Electrical and Electronics Engineers, Inc. - Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains

2006 IEEE International Test Conference

Author(s): Hyunbean Yi ; Jaehoon Song ; Sungju Park
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Santa Clara, CA, USA
Conference Date: 22 October 2006
Page(s): 1 - 7
ISBN (CD): 1-4244-0292-1
ISBN (Paper): 1-4244-0291-3
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2006.297632
Regular:

This paper introduces an efficient interconnect delay fault test (IDFT) controller on boards and SoCs with IEEE 1149.1 and IEEE 1500 wrappers. By capturing the transition signals launched during... View More

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