IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design for Board and System Level Structural Test and Diagnosis

2006 IEEE International Test Conference

Author(s): Toai Vo ; Zhiyuan Wang ; T. Eaton ; P. Ghosh ; Huai Li ; Young Lee ; Weili Wang ; Rong Fang ; D. Singletary ; Xinli Gu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Santa Clara, CA, USA
Conference Date: 22 October 2006
Page(s): 1 - 10
ISBN (CD): 1-4244-0292-1
ISBN (Paper): 1-4244-0291-3
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2006.297631
Regular:

The success of system test is measured by test quality and cost. System test quality and cost rely on several factors, such as component and board test quality, system test completeness, the... View More

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