IEEE - Institute of Electrical and Electronics Engineers, Inc. - Perfect data reconstruction algorithm of time interleaved ADCs

2006 IEEE International Test Conference

Author(s): Fang Xu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Santa Clara, CA, USA
Conference Date: 22 October 2006
Page(s): 1 - 6
ISBN (CD): 1-4244-0292-1
ISBN (Paper): 1-4244-0291-3
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2006.297630
Regular:

This paper analyzes the effects of gain, phase and timing imperfections in a time interleaved ADC structure by building a mathematical model, proposes a complete and perfect solution by solving... View More

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