IEEE - Institute of Electrical and Electronics Engineers, Inc. - Recognition of Sensitized Longest Paths in Transition Delay Test

2006 IEEE International Test Conference

Author(s): S. Hamada ; T. Maeda ; A. Takatori ; Y. Noduyama ; Y. Sato
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 October 2006
Conference Location: Santa Clara, CA, USA
Conference Date: 22 October 2006
Page(s): 1 - 6
ISBN (CD): 1-4244-0292-1
ISBN (Paper): 1-4244-0291-3
ISSN (Paper): 1089-3539
DOI: 10.1109/TEST.2006.297622
Regular:

The progress of design and fabrication technologies has led to an increase in small delay failures in systems-on-a-chip. To evaluate the delay testing quality accurately, the authors have already... View More

Advertisement