IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automatic System of Seeds Refined Grading Based on Machine Vision

Sixth World Congress on Intelligent Control and Automation

Author(s): Yi Xun ; Junxiong Zhang ; Wei Li ; Weiguo Cai
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Dalian, China
Conference Date: 21 June 2006
Volume: 2
Page(s): 9,686 - 9,689
ISBN (Paper): 1-4244-0332-4
DOI: 10.1109/WCICA.2006.1713883
Regular:

An automatic seed grading and selecting system based on machine vision dynamic inspection technology was developed. The working principle of the inspection system and a whole structure of the... View More

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