IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of Performance and Capacitance Sensitivity Distributions of Sensor for Electrical Capacitance Tomography System

Sixth World Congress on Intelligent Control and Automation

Author(s): Liquan Sun ; Deyun Chen ; Guibin Zheng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Dalian, China
Conference Date: 21 June 2006
Volume: 1
Page(s): 4,977 - 4,981
ISBN (Paper): 1-4244-0332-4
DOI: 10.1109/WCICA.2006.1713334
Regular:

The sensitivity-field distribution of sensors in the electrical capacitance tomography (ECT) system is influenced by the distribution of multiphase-flow media, and the soft-field characteristics... View More

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