IEEE - Institute of Electrical and Electronics Engineers, Inc. - Impact of a (m,k)-firm Data Dropouts Policy on the Quality of Control

2006 IEEE International Workshop on Factory Communication Systems

Author(s): F. Flavia ; Jia Ning ; Song YeQiong ; S.-L. Francoise
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Torino, Italy, Italy
Conference Date: 28 June 2006
Page Count: 7
Page(s): 353 - 359
ISBN (Paper): 1-4244-0379-0
DOI: 10.1109/WFCS.2006.1704178
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