IEEE - Institute of Electrical and Electronics Engineers, Inc. - A fusion methodology based on Dempster-Shafer evidence theory for two biometric applications

2006 18th International Conference on Pattern Recognition

Author(s): M. Arif ; T. Brouard ; N. Vincent
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 4
Page(s): 590 - 593
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.68
Regular:

Different features carry more or less rich and varied pieces of information to characterize a pattern. The fusion of these different sources of information can provide an opportunity to develop... View More

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