IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sparse Bayesian Regression for Head Pose Estimation

2006 18th International Conference on Pattern Recognition

Author(s): Yong Ma ; Yoshinori Konishi ; Koichi Kinoshita ; Shihong Lao ; Masato Kawade
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 3
Page(s): 507 - 510
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.1067
Regular:

This paper presents a high performance head pose estimation system based on the newly-proposed sparse Bayesian regression technique (relevance vector machine, RVM) and sparse representation of... View More

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