IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improving Text Classifier Performance based on AUC

2006 18th International Conference on Pattern Recognition

Author(s): A.K.S. Wong ; J.W.T. Lee ; D.S. Yeung
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 3
Page(s): 268 - 271
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.705
Regular:

To evaluate the performance of text classifiers, we usually look at measures related to precision and recall, and most machine learning methods are optimized for these measures. In recent year,... View More

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