IEEE - Institute of Electrical and Electronics Engineers, Inc. - Class Separability in Spaces Reduced By Feature Selection

2006 18th International Conference on Pattern Recognition

Author(s): E. Pranckeviciene ; Tin Kam Ho ; R. Somorjai
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 3
Page(s): 254 - 257
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.365
Regular:

We investigated the geometrical complexity of several high-dimensional, small sample classification problems and its changes due to two popular feature selection procedures, forward feature... View More

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