IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistical Borders for Incremental Mining

2006 18th International Conference on Pattern Recognition

Author(s): R. Nock ; P.-A. Laur ; J.-E. Symphor
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 3
Page(s): 212 - 215
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.1076
Regular:

Data streams - dataflows in which the information arrives in a timely manner - have recently become a major subfield of knowledge extraction. One of their most important singularity is that only a... View More

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