IEEE - Institute of Electrical and Electronics Engineers, Inc. - Basic Concepts For Testing The Torah Code Hypothesis

2006 18th International Conference on Pattern Recognition

Author(s): R.M. Haralick
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 3
Page(s): 104 - 109
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.315
Regular:

This is the first part of a tutorial discussing the major strategies and methodologies by which a test of the Null hypothesis of no Torah effect can be done. The basic concepts of equidistant... View More

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