IEEE - Institute of Electrical and Electronics Engineers, Inc. - Genetic-based K-means algorithm for selection of feature variables

2006 18th International Conference on Pattern Recognition

Author(s): Zhiwen Yu ; Hau-San Wong
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 2
Page(s): 744 - 747
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.603
Regular:

This paper proposes a genetic-based K-means (GK) algorithm for selection of the k value and selection of feature variables by minimizing an associated objective function. The algorithm combines... View More

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