IEEE - Institute of Electrical and Electronics Engineers, Inc. - Line-Based Affine Invariant Object Location Using Transformation Space Decomposition

2006 18th International Conference on Pattern Recognition

Author(s): R. Yang ; Yongsheng Gao
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 2
Page(s): 646 - 649
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.765
Regular:

This paper presents a novel line-based affine invariant object location methodology. Our algorithm employs a new line-based transformation space decomposition technique to exploit intrinsic... View More

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