IEEE - Institute of Electrical and Electronics Engineers, Inc. - New MRF Parameter Estimation Technique for Texture Image Segmentation using Hierarchical GMRF Model Based on Random Spatial Interaction and Mean Field Theory

2006 18th International Conference on Pattern Recognition

Author(s): Dong Hwan Kim ; Il Dong Yun ; Sang Uk Lee
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 2
Page(s): 365 - 368
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.856
Regular:

This paper presents a new Markov random field (MRF) parameter estimation technique using hierarchical MRF model based on the random spatial interaction (RSI) and the mean field theory for the... View More

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