IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multi-Resolution Curve Alignment Based on Salient Features

2006 18th International Conference on Pattern Recognition

Author(s): Zheng Li ; Xiaonan Luo ; Chengying Gao
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 2
Page(s): 357 - 360
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.830
Regular:

In this paper, we present a novel approach to the problem of curve alignment, which measures and matches the similarity of two curves. Our method extracts curve features with high priorities given... View More

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