IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multi-Resolution Curve Alignment Based on Salient Features
2006 18th International Conference on Pattern Recognition
Author(s): | Zheng Li ; Xiaonan Luo ; Chengying Gao |
Sponsor(s): | IEEE CPS |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 January 2006 |
Conference Location: | Hong Kong, China |
Conference Date: | 20 August 2006 |
Volume: | 2 |
Page(s): | 357 - 360 |
ISBN (Paper): | 0-7695-2521-0 |
ISSN (Paper): | 1051-4651 |
DOI: | 10.1109/ICPR.2006.830 |
Regular:
In this paper, we present a novel approach to the problem of curve alignment, which measures and matches the similarity of two curves. Our method extracts curve features with high priorities given... View More