IEEE - Institute of Electrical and Electronics Engineers, Inc. - The effect of texture representations on AAM performance

2006 18th International Conference on Pattern Recognition

Author(s): P. Kittipanya-ngam ; T.F. Cootes
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 2
Page(s): 328 - 331
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.1117
Regular:

The active appearance model (AAM) algorithm matches statistical models of shape and texture to images rapidly by assuming a linear relationship between the texture residual and changes in the... View More

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