IEEE - Institute of Electrical and Electronics Engineers, Inc. - Euclidean Quality Assessment for Binary Images

2006 18th International Conference on Pattern Recognition

Author(s): Chune Zhang ; Zhengding Qiu ; Dongmei Sun ; Jie Wu
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 2
Page(s): 300 - 303
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.508
Regular:

An objective quality assessment algorithm special for binary images is proposed. In the algorithm Euclidean distance between noise and signal points measures the noise energy and the Euler number... View More

Advertisement