IEEE - Institute of Electrical and Electronics Engineers, Inc. - Independent component analysis based filter design for defect detection in low-contrast textured images

2006 18th International Conference on Pattern Recognition

Author(s): Du-Ming Tsai ; Yan-Hsin Tseng ; Shin-Min Chao ; Chao-Hsuan Yen
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 2
Page(s): 231 - 234
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.709
Regular:

In this paper, we propose a convolution filtering scheme for detecting defects in low-contrast textured surface images and, especially, focus on the application for glass substrates in liquid... View More

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