IEEE - Institute of Electrical and Electronics Engineers, Inc. - Texture Edge Detection using Multi-resolution Features and SOM

2006 18th International Conference on Pattern Recognition

Author(s): L. Gupta ; S. Das
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 2
Page(s): 199 - 202
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.1111
Regular:

Texture boundaries or edges are useful information for segmenting a texture image. We propose a texture edge detection algorithm using a bank of 1D multi-channel, multi-resolution filters and self... View More

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