IEEE - Institute of Electrical and Electronics Engineers, Inc. - Texture Edge Detection using Multi-resolution Features and SOM
2006 18th International Conference on Pattern Recognition
Author(s): | L. Gupta ; S. Das |
Sponsor(s): | IEEE CPS |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 January 2006 |
Conference Location: | Hong Kong, China |
Conference Date: | 20 August 2006 |
Volume: | 2 |
Page(s): | 199 - 202 |
ISBN (Paper): | 0-7695-2521-0 |
ISSN (Paper): | 1051-4651 |
DOI: | 10.1109/ICPR.2006.1111 |
Regular:
Texture boundaries or edges are useful information for segmenting a texture image. We propose a texture edge detection algorithm using a bank of 1D multi-channel, multi-resolution filters and self... View More