IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Charged Geometric Model for Active Contours
2006 18th International Conference on Pattern Recognition
Author(s): | Ronghua Yang ; M. Mirmehdi |
Sponsor(s): | IEEE CPS |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 January 2006 |
Conference Location: | Hong Kong, China |
Conference Date: | 20 August 2006 |
Volume: | 2 |
Page(s): | 183 - 186 |
ISBN (Paper): | 0-7695-2521-0 |
ISSN (Paper): | 1051-4651 |
DOI: | 10.1109/ICPR.2006.41 |
Regular:
This paper presents a new deformable model based on charged particle dynamics and geometric contour propagation. It detects object boundaries with a charged active contour that propagates under... View More