IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Charged Geometric Model for Active Contours

2006 18th International Conference on Pattern Recognition

Author(s): Ronghua Yang ; M. Mirmehdi
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 2
Page(s): 183 - 186
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.41
Regular:

This paper presents a new deformable model based on charged particle dynamics and geometric contour propagation. It detects object boundaries with a charged active contour that propagates under... View More

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