IEEE - Institute of Electrical and Electronics Engineers, Inc. - Matching Images Features in a Wide Base Line with ICA Descriptors

2006 18th International Conference on Pattern Recognition

Author(s): R. Munguia ; A. Grau ; A. Sanfeliu
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 2
Page(s): 159 - 162
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.783
Regular:

In this paper we present a method to recognize images features with a wide base line between learning and recognition phases. The method is based in feature descriptors derived from independent... View More

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