IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fast Linear Discriminant Analysis Using Binary Bases

2006 18th International Conference on Pattern Recognition

Author(s): Feng Tang ; Hai Tao
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 2
Page(s): 52 - 55
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.547
Regular:

Linear discriminant analysis (LDA) is a widely used technique for pattern classification. It seeks the linear projection of the data to a low dimensional subspace where the data features can be... View More

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