IEEE - Institute of Electrical and Electronics Engineers, Inc. - A MOE framework for Biclustering of Microarray Data

2006 18th International Conference on Pattern Recognition

Author(s): S. Mitra ; H. Banka ; S.K. Pal
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 1
Page(s): 1,154 - 1,157
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.105
Regular:

Biclustering or simultaneous clustering of both genes and conditions have generated considerable interest over the past few decades, particularly related to the analysis of high-dimensional gene... View More

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