IEEE - Institute of Electrical and Electronics Engineers, Inc. - Detecting Virulent Cells of Cryptococcus Neoformans Yeast: Clustering Experiments

2006 18th International Conference on Pattern Recognition

Author(s): Jinshuo Liu ; P. van der Putten ; F. Hagen ; Xinmeng Chen ; T. Boekhout ; F.J. Verbeek
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 1
Page(s): 1,112 - 1,115
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.437
Regular:

The yeast cryptococcus neoformans can cause dangerous infections such as meningitis. The presence of a thick capsule is shown to be correlated with virulence of a yeast cell. This paper reports on... View More

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