IEEE - Institute of Electrical and Electronics Engineers, Inc. - Unsupervised Discriminant Projection Analysis for Feature Extr

2006 18th International Conference on Pattern Recognition

Author(s): Jian Yang ; D. Zhang ; Zhong Jin ; Jing-yu Yang
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 1
Page(s): 904 - 907
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.1143
Regular:

This paper develops an unsupervised discriminant projection (UDP) technique for feature extraction. UDP takes the local and non-local information into account, seeking to find a projection that... View More

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