IEEE - Institute of Electrical and Electronics Engineers, Inc. - On-line machine vision system for detect split defects in sheet-metal forming processes

2006 18th International Conference on Pattern Recognition

Author(s): F. Gayubo ; J.L. Gonzalez ; E. de la Fuente ; F. Miguel ; J.R. Peran
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 1
Page(s): 723 - 726
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.902
Regular:

In this paper, we present an automatic system designed for detect the presence of split defects in sheet-metal forming processes. The image acquisition system includes basically a CCD progressive... View More

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