IEEE - Institute of Electrical and Electronics Engineers, Inc. - Object Contour Detection Using Spatio-temporal Self-sim

2006 18th International Conference on Pattern Recognition

Author(s): H. Takeshima ; T. Ida ; T. Kaneko
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 1
Page(s): 613 - 617
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.875
Regular:

A novel contour detector that refines a rough boundary between an object and a background to a precise boundary in moving pictures robustly is proposed. To estimate boundaries of objects, the... View More

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