IEEE - Institute of Electrical and Electronics Engineers, Inc. - Using Evolution to Learn How to Perform Interest Point Detection

2006 18th International Conference on Pattern Recognition

Author(s): L. Trujillo ; G. Olague
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 1
Page(s): 211 - 214
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.1153
Regular:

The performance of high-level computer vision applications is tightly coupled with the low-level vision operations that are commonly required. Thus, it is advantageous to have low-level feature... View More

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