IEEE - Institute of Electrical and Electronics Engineers, Inc. - Correlation Based Image Defect Detection

2006 18th International Conference on Pattern Recognition

Author(s): T. Amano
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 1
Page(s): 163 - 166
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.419
Regular:

The defect inspection that used image sensing such as automated pattern inspection is a useful solution to automatize the visual check, not limit to factory automation field. Mostly such defect... View More

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