IEEE - Institute of Electrical and Electronics Engineers, Inc. - Concurrent Stereo under Photometric Image Distortions

2006 18th International Conference on Pattern Recognition

Author(s): G. Gimel'farb ; Jiang Liu ; J. Morris ; P. Delmas
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 1
Page(s): 111 - 114
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.401
Regular:

We have improved our concurrent stereo matching (CSM) algorithm, which abandons the search for 'best' matches and determine matches that lie within admissible ranges using a noise model. We... View More

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