IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust Factorisation with Uncertainty Analysis

2006 18th International Conference on Pattern Recognition

Author(s): S.S. Brandt
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 1
Page(s): 39 - 42
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.1005
Regular:

This paper proposes how the classic factorisation algorithm for affine reconstruction can be extended to be robust to outliers and proposes how the uncertainty analysis can be performed in this... View More

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