IEEE - Institute of Electrical and Electronics Engineers, Inc. - 2D and 3D Vegetation Resource Parameters Assessment using Marked Point Processes

2006 18th International Conference on Pattern Recognition

Author(s): G. Perrin ; X. Descombes ; J. Zerubia
Sponsor(s): IEEE CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Hong Kong, China
Conference Date: 20 August 2006
Volume: 1
Page(s): 1 - 4
ISBN (Paper): 0-7695-2521-0
ISSN (Paper): 1051-4651
DOI: 10.1109/ICPR.2006.20
Regular:

High resolution aerial and satellite images of forests have a key role to play in natural resource management. As they enable to study forests at the scale of trees, it is now possible to get a... View More

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