IEEE - Institute of Electrical and Electronics Engineers, Inc. - Computing Complete Test Graphs for Hierarchical Systems

Fourth IEEE International Conference on Software Engineering and Formal Methods

Author(s): D. D'Souza ; M. Gopinathan
Sponsor(s): IEEE Comput. Soc
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Pune, India
Conference Date: 11 September 2006
Page(s): 70 - 79
ISBN (Paper): 0-7695-2678-0
DOI: 10.1109/SEFM.2006.13
Regular:

Conformance testing focuses on checking whether an implementation under test (IUT) behaves according to its specification. Typically, testers are interested in performing targeted tests that... View More

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