IEEE - Institute of Electrical and Electronics Engineers, Inc. - Computing Complete Test Graphs for Hierarchical Systems
Fourth IEEE International Conference on Software Engineering and Formal Methods
Author(s): | D. D'Souza ; M. Gopinathan |
Sponsor(s): | IEEE Comput. Soc |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 January 2006 |
Conference Location: | Pune, India |
Conference Date: | 11 September 2006 |
Page(s): | 70 - 79 |
ISBN (Paper): | 0-7695-2678-0 |
DOI: | 10.1109/SEFM.2006.13 |
Regular:
Conformance testing focuses on checking whether an implementation under test (IUT) behaves according to its specification. Typically, testers are interested in performing targeted tests that... View More