IEEE - Institute of Electrical and Electronics Engineers, Inc. - Invited Paper: Pattern Matching Using n-Gram Sampling of Cumulative Algebraic Signatures: Preliminary Results

Seventeenth International Conference on Database and Expert Systems Applications

Author(s): W. Litwin ; R. Mokadem ; P. Rigaux ; S. Thomas
Sponsor(s): CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Krakow, Poland
Conference Date: 4 September 2006
Page(s): 251 - 255
ISBN (Paper): 0-7695-2641-1
ISSN (Paper): 1529-4188
DOI: 10.1109/DEXA.2006.80
Regular:

We propose a novel string (pattern) matching algorithm called n-gram search. We intend it for the records stored once and searched many times in a database or a file, especially those organized in... View More

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