IEEE - Institute of Electrical and Electronics Engineers, Inc. - Architecture Evaluation for Distributed Auto-ID Systems

Seventeenth International Conference on Database and Expert Systems Applications

Author(s): Hong-Hai Do ; J. Anke ; G. Hackenbroich
Sponsor(s): CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Krakow, Poland
Conference Date: 4 September 2006
Page(s): 30 - 34
ISBN (Paper): 0-7695-2641-1
ISSN (Paper): 1529-4188
DOI: 10.1109/DEXA.2006.30
Regular:

Auto-ID technologies allow capturing the time and location of products in the supply chain for tracking and tracing. This paves the way for a variety of business applications, such as... View More

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