IEEE - Institute of Electrical and Electronics Engineers, Inc. - Performance Analysis of the \varphi Failure Detector with its Tunable Parameters

Seventeenth International Conference on Database and Expert Systems Applications

Author(s): N. Hayashibara ; M. Takizawa
Sponsor(s): CPS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: Krakow, Poland
Conference Date: 4 September 2006
Page(s): 20 - 24
ISBN (Paper): 0-7695-2641-1
ISSN (Paper): 1529-4188
DOI: 10.1109/DEXA.2006.111
Regular:

In this paper, we explain an implementation of an accrual failure detector, that we call the phi failure detector. The particularity of the phi failure detector is that it dynamically adjusts to... View More

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