IEEE - Institute of Electrical and Electronics Engineers, Inc. - A 14b 100MS/s DAC with Fully Segmented Dynamic Element Matching

2006 IEEE International Solid-State Circuits Conference. Digest of Technical Papers

Author(s): Kok Lim Chan ; I. Galton
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: San Francisco, CA, USA
Conference Date: 6 February 2006
Page Count: 10
Page(s): 2,390 - 2,399
ISBN (Paper): 1-4244-0079-1
ISSN (Paper): 0193-6530
DOI: 10.1109/ISSCC.2006.1696302
Regular:

A 14b 100MS/s Nyquist-rate DAC using a segmented dynamic-element-matching technique involving all the DAC elements is demonstrated. The DAC is implemented in a 0.18mum CMOS process and... View More

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