IEEE - Institute of Electrical and Electronics Engineers, Inc. - A leakage current replica keeper for dynamic circuits

2006 IEEE International Solid-State Circuits Conference. Digest of Technical Papers

Author(s): Y. Lih ; N. Tzartzanis ; W.W. Walker
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: San Francisco, CA, USA
Conference Date: 6 February 2006
Page Count: 10
Page(s): 1,755 - 1,764
ISBN (Paper): 1-4244-0079-1
ISSN (Paper): 0193-6530
DOI: 10.1109/ISSCC.2006.1696232
Regular:

A 1T-overhead keeper circuit for dynamic gates replicates the evaluation stack leakage current and thus provides PVT tracking. Implemented in a 90nm CMOS process, the keeper enables design of... View More

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