IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistical analysis of SRAM cell stability

2006 Design Automation Conference

Author(s): K. Agarwal ; S. Nassif
Sponsor(s): SiCda
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: San Francisco, CA, USA
Conference Date: 24 July 2006
Page(s): 57 - 62
ISBN (Paper): 1-59593-381-6
ISSN (Paper): 0738-100X
DOI: 10.1145/1146909.1146928
Regular:

The impact of process variation on SRAM yield has become a serious concern in scaled technologies. In this paper, we propose a methodology to analyze the stability of an SRAM cell in the presence... View More

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