IEEE - Institute of Electrical and Electronics Engineers, Inc. - Visibility enhancement for silicon debug

2006 Design Automation Conference

Author(s): Yu-Chin Hsu ; Furshing Tsai ; Wells Jong ; Ying-Tsai Chang
Sponsor(s): SiCda
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Conference Location: San Francisco, CA, USA
Conference Date: 24 July 2006
Page(s): 13 - 18
ISBN (Paper): 1-59593-381-6
ISSN (Paper): 0738-100X
DOI: 10.1109/DAC.2006.238670
Regular:

Several emerging design-for-debug (DFD) methodologies are addressing silicon debug by making internal signal values and other data observable. Most of these methodologies require the... View More

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